X
Your request has been saved.

It concerns the following products :


Do you want to send it now or do you have other request?

NFC, E-PAYMENT & WIRELESS POWER TESTING

Micropross design R&D and Manufacturing test tools which characterize and test the electrical and protocol performance of products such as smart cards, smartphones and smart object in design, conformance and production

CONTACT-US

NFC, E-PAYMENT & WIRELESS POWER TESTING

Micropross design R&D and Manufacturing test tools which characterize and test the electrical and protocol performance of products such as smart cards, smartphones and smart object in design, conformance and production

CONTACT-US

NFC, E-PAYMENT & WIRELESS POWER TESTING

Micropross design R&D and Manufacturing test tools which characterize and test the electrical and protocol performance of products such as smart cards, smartphones and smart object in design, conformance and production

CONTACT-US

MP300 TC3

Contact smart cards tester

Request for a quote

The MP300 TC3 is the worldwide reference for test of contact smart cards and secure elements. Shipped to hundreds of units worldwide, its numerous test features make this tool the ideal companion for characterisation of components, and type approval at validation laboratories.
The MP300 TC3 main features are :

  • Terminal simulation following the ISO 7816, SWP/HCI, I2C, SPI, USB 2.0, USB-IC protocols
  • Able to test ID-1 smart cards, SIM and U-SIM components, eSIM as well as M2M modules
  • Fully compatible with the requirement of the ISO 7816 (ISO 10373-3) test specification
  • Completely supports the ETSI TS 102 613 and TS 102 622 specifications
  • Records the communication between itself, and the device under test, and offers a graphical display of the spied data
  • External spy mode also available
  • Very deep possibilities of customisation of physical and protocol parameters
  • Numerous measurement features and test implemented : current, voltage, open/short, capacitance, ...
  • Reference tester for numerous test standards : EMVCo L1 electrical and protocol, ISO 7816-3, ETSI TS 102 613 and TS 102 622

 

Supported protocols

  • ISO/IEC 7816-3

-T=0 and T=1 protocols : 100% implemented, managed by Firmware and FPGA, accelerated by hardware

  • SWP/HCI (ETSI TS 102.613 and ETSI TS 102.622)

-SWP transmission : Assisted by hardware
-LLC layers support : ACT, CLT, S-HDLC realised by firmware

  • USB-IC
  • USB 2.0

-Available speeds : Low speed, full speed
-Classes : ISO/IEC 7816-12, mass storage, custom protocols

  • I2C

modes supported :
-Standard mode
-Fast mode
-Fast mode plus
-Supports clock stretching, multi master arbitration, anti tearing
-Programmable parameters :
         +Setup time, hold time, start and stop condition
         +Clock high and low states
         +Address width (7 and 10 bits)
         +Nack condition

  • SPI

-Data width : 8 bits
-programmable parameters :
    +phase, polarity
    +anti tearing

  • Synchronous chips

-Support of all kind of memory components (SLE 46xx, T2G, …)
Raw mode
-Implementation of custom protocols and support of out of standard chips

Programmable parameters

Physical parameters

  • Voltages

-Vcc : Adjustable from 0V to 10V
-Vol/Voh :
    +0V to 5V / 1V to 7V
    +All pins can be adjusted independently
-Vil/Vih :
    - 0.2V to 5V / 1V to 6.8V

Clock frequency

-ISO 7816 clock :
    +Adjustable from 10kHz to 10Mhz
    +Duty cycle : can be adjusted from 30% to 70%
-SPI clock :
-Adjustable up to 25MHz
-Pin states
    +All pins can be managed separately

  • ISO 7816 communication parameters

-Adjustable parameters : All normative timings (WWT, BWT, CWT, …), parity, pull-up resistor

  • SWP communication parameters

Available baudrates :

- Any baudrate from 49kbps to 1,9Mbps
- SWP duty cycle adjustable from 0% to 50%
- Adjustable parameters : Activation time, P2, P3 parameters, current detection level

  • USB-IC parameters

-Voltage classes supported : 1.8V and 3.0V

 

Spy feature

  • Accuracy : 20 ns
  • Signals displayed :

- All 8 pins (C1 C2 C3 C4 C6 C7 C8)
- SWP S1, S2
- USB
- Bytes
- Frames
- Trigger states

  • I2C start and stop conditions, ACK/NACK, SDA/SCL transitions
  • SPI SCK, MOSI, LISO, SS transitions
  • Analog information (current, voltage measurement)

Available tests

  • Electrical tests

- Open/short test (on all contacts,current forced can be adjusted)
- Leakage current (all contacts)
- Voltage measurement (all contacts, static, dynamic, burst mode)
- Current measurement (all contacts, static, dynamic, burst mode)
- Parametric tests (V=f(I), I=f(V))
- SWP specific measurement (statistics on SWP S2 current values)

  • Logical tests

- Anti tearing (checks the chip's integrity against accidental removing from the reader)
- All timing measurement
- ISO 7816 and SWP concurrent I/O testing : send frames in ISO and SWP simultaneously


The MP300 TC3 is typically used in the following contexts :

  • Debug of a contact smartcard OS
  • Type approval following the EMVCo and SWP/HCI specifications
  • Characterisation of a contact component
  • Quality inspection