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NFC, E-PAYMENT & WIRELESS POWER TESTING

Micropross design R&D and Manufacturing test tools which characterize and test the electrical and protocol performance of products such as smart cards, smartphones and smart object in design, conformance and production

CONTACT-US

NFC, E-PAYMENT & WIRELESS POWER TESTING

Micropross design R&D and Manufacturing test tools which characterize and test the electrical and protocol performance of products such as smart cards, smartphones and smart object in design, conformance and production

CONTACT-US

NFC, E-PAYMENT & WIRELESS POWER TESTING

Micropross design R&D and Manufacturing test tools which characterize and test the electrical and protocol performance of products such as smart cards, smartphones and smart object in design, conformance and production

CONTACT-US

MP300 CL3

NFC devices production tester

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The MP300 CL3 is dedicated to the test of NFC devices (handsets, tablet PC, smart watch, ...) in a production context. It is able to test all the features of a NFC device that matter (terminal simulation, card simulation, resonance frequency, ...) in an automated, strurdy, operator friendly test tool.

The main characteristics of the MP300 CL3 are :

  • Test in production of contactless smartcards, RFID tags, M2M modules, chip on tape (COT) micro modules, and NFC devices
  • Coverage of all protocol that matters : ISO 14443 A/B, ISO 15693, FeliCaTM, MifareTM, B' (Innovatron), and all NFC Forum tags
  • Coverage of high speed communication (VHBR) in both ASK and PSK modes
  • Total flexibility in the definition of the test parameters (field strength, rise/fall times, modulation index, load modulation amplitude (smartcard simulation), load on the DUT field (smartcard simulation)
  • Numerous test implemented (resonance frequency, Q factor, complex impedance, field strength measurement, ...)
  • Ideal tool to test and personalize form factors such as ID-1 smartcards, M2M modules, tape of components (COT), NFC devices
  • Easy to control thanks to its open API
  • Numerous antennas available, including a dual PCD mode-PICC mode model
  • Modularity : possibility to have two MP300 CL3 on the same MP300 mother board
  • Modularity : possibility to have the MP300 CL3 installed together with a MP300 C3 for test of dual interface micro modules
  • Presence of a SAM card reader
  • Ideal tool to perform Mastercard CQM test requirements
  • Tool ready to test power transmitters in a production context, following the WPC specifications

More information on the MP300 CL3 and our solutions for the test of NFC devices in a manufacturing environment can be found here.

Supported protocols

ISO/IEC 14443 (proximity)
- Supported data rates :
    - 106, 212, 424, 848 kbps
    - VHBR optionnal. Support of ASK and PSK modulations
    - Asymetrical baudrates supported

B' (Innovatron)


ISO/IEC 15693 (Vicinity cards)

- Supported data rates :
    - Low & high data rate
    - 1 out of 4, 1 out of 256
- Tag behaviour
    - 1 sub carrier
    - 2 sub carriers

ISO 18000-3 Mode 1

Mifare
- Supported versions : Classic, Light, Ultra Light, Ultra Light C, Desfire

FeliCa
- Supported data rates : 212, 424 kbps

NFC Forum modes
- Peer 2 Peer, Listening, Polling

NFC Forum tag
- Tag type 1 (Innovision Topaz)
- Tag type 2 (MifareTM Ultra Light)
- Tag type 3 (FeliCaTM)
- Tag type 4 (ISO 14443 A/B)

ISO 18092 (NFC-IP1)
- Supported communication mechanisms : Active/passive mode, initiator/target

Raw mode
- Possibility to implement custom protocols

 

Programmable parameters

Physical parameters (all types)
- Field strength
- Rise/fall time of the modulation
- Modulation index
- Pause time (ISO 14443 A & ISO 15693)
- Duration of each bit + EOF + SOF (ISO 14443 A)
- Load modulation amplitude (contactless smartcard simulation)
- Load on the reader field (contactless smartcard simulation)

Logical parameters
- Type A pause
- FWT, TR0, TR1, TR2
- Communication speed
- Response time (contactless smartcard simulation)

Available tests

Electrical testing for NFC devices
- Test of the NFC device Card Emulation mode :
    - Generation of different waveshapes (ISO 14443 A/B, FeliCaTM, ISO 15693) at different physical conditions (field strength, rise/fall times, modulation index, ...)
    - Measurement of the NFC device response Load Modulation Amplitude

- Test of the NFC device Reader/Writer mode :
    - Generation of different waveshapes (ISO 14443 A/B, FeliCaTM, ISO 15693) at different physical conditions (load modulation amplitude, positive/negative modulation, ...)
    - Measurement of the emitted field strength
    - Test at different loads on the field
    - Characterization of the reader/writer mode waveshapes (rise/fall times, overshoot, modulation index, ...)

- Resonance frequency / Q factor
    - Measurement done at different field strength
    - Correlation with a VNA

Logical testing

- Numerous timing controlled pre-implemented sequences (ex : Field on to REQA/REQB)
- Anti-tearing test
- Framing (parity error simulation, CRC error, protocol error, timing (short response, long response, …)

Also available
- Complex impedance
    - Resistor, Inductance, Capacitance
    - Direct computation of Rp//Cp
- Measurement of chip and antenna impedance
- Open/short testing


The MP300 CL3 will typically be used in the following contexts :

  • test in production lines of smart objects, such as NFC devices
  • quality inspection of NFC devices
  • test of smart watches