MP300 TPC1

A high performance production tester for Mega SIM micromodules and smartcards

  • Supports ISO/IEC 7816, USB 2.0, SD/MMC protocols

  • Supports memory chip access

  • Features market acclaimed electrical measurement

  • Optimised to reach the highest data transfert speed


The main features of the MP300 TPC1 are :

  • Possibility to install up to 4 MP300 TPC1 modules on the same mother board
  • Support of the ISO/IEC 7816-3 and –4 protocols
  • Full implementation of the T=0 and T=1 protocols
  • Support of SD/MMC and USB 2.0 protocols
  • Support of numerous memory chips
  • Open for implementation of custom protocols
  • Endless possibilities of protocolary customisation
  • Support of the fastest smartcards
  • Compatible with wafers, micro-modules, smartcards, M2M components
  • Fast hardware assisted data transmission mechanism, ensuring the maximum throughput for CPU and memory modules
  • Advanced electrical test and measurement features (open/short, leakage, chip consumption, ...)
  • Open platform : integrate the MP300 TPC1 inside your own personalisation environment
  • Compatible with the MVPi production machine interface

 

This production tester will typically be used in the following contexts :

  • OS loading, pre-personalisation, or personalisation of micro-modules and smartcards
  • Personalisation of SIM, U-SIM, Mega-SIM and banking cards
  • Reel to reel test handlers

 

Number of independent test heads per board : 1

Supported protocols

ISO/IEC 7816-3
T=0 and T=1 protocols
  • 100% implemented, managed by firmware
Hardware acceleration
  • Transmission and reception of characters managed by the MicroSmart technology

MMC 4.1 / SD
Data bits
  • 1 and 4 data bits
File format
  • Can be implemented on demand
Low level commands
  • Available

USB 2.0

Available speeds
  • Low speed, full speed
Classes
  • ISO/IEC 7816-12, mass storage, custom protocols

Synchronous chips (memory chips)
Available libraries
  • T2G
  • Eurochip
  • SLE 4442
  • SLE 4407
  • AT24CXX
Custom protocols development
  • Available
Hardware acceleration
  • Available

Raw mode
Gives the possibility to exchange frames without any Protocolary encapsulation

Out of standard chips support

Benefit from Micropross’ experience in smart card programming

Programmable parameters

Physical parameters

Voltages
Vcc
  • 0V to 5.5V
Vol
  • 0V
Voh
  • 1.65V to 5.5V
Vil
  • 30% of Voh
Vih
  • 70% of Voh

Frequency
ISO 7816 and MMC/SD clock frequency
  • 10kHz to 20MHz
ISO 7816 clock duty cycle
  • 30% to 70%

Pin states
All pins are independent from each other, and can be separately managed.

ISO 7816 communication parameters
ETU width
  • From 1 to 4096 clock cycles (bit sampling adjustable)
BGT, initial ETU width
  • Adjustable in clock cycles
BWT, CWT, EGT, RGT, WWT
  • Adjustable in ETUs
Clock stop at high or low state
  • Adjustable
Clock stop tG and tH timings
  • Adjustable in clock cycles
Parity control
  • Can be forced to 0, 1, odd, even
Input parity error checking
  • Can be disabled
Pull-up resistor
  • 5kΩ or 20kΩ

Available tests

Electrical tests

Open/short test
Available contacts
  • Contact C1, C2, C3, C4, C5, C6, C7, C8
Forced current
  • Adjustable between –500µA and 500µA

Leakage current measurement
Available contacts
  • Contact C1, C2, C3, C4, C6, C7, C8
Measurement ranges
  • +/- 5mA
  • + - 500µA

Voltage measurement
Available contacts
  • Contacts C1, C2, C3, C4, C6, C7, C8
Range available
  • +/- 10V (accuracy : 20mV)
Modes available
  • Dynamic mode : we give you an analog like vision of the voltage on the pin you chose from the moment you chose
  • Static mode : we give you the instant voltage value

Current measurement
Available contacts
  • Contacts C1, C2, C3, C4, C6, C7, C8
Ranges available
  • +/- 250mA
  • +/- 100mA
  • +/- 25mA
  • +/- 5mA
  • +/- 500µA
Modes available
  • Dynamic mode : we give you an analog like vision of the current on the pin you chose from the moment you chose
  • Static mode : we give you the instant current value on the selected contact

Parametric tests
Available contacts
  • Contacts C1, C2, C3, C4, C6, C7, C8
Modes available
  • Force a current, measure a voltage
  • Force a voltage, measure a current

 

Logical tests

Anti tearing test
Simulate the chip's immunity against tearing from the reader

Timing measurement
Measure the chip response to a command

Personalisation assisted by hardware
Do not lose a microsecond while sending data to the chip thanks to the hardware assisted data sending mechanism

Memory extension

Possibility to extend the memory size available, by using a high memory density MMC/SD SIM chip. This component can also be used as reference memory, whose content will be copied automatically inside the target SD/MMC card

Communication parameters

USB 2.0
TCP/IP 10/100 Mbps
RS 232

Software development

Remote development (the code is executed from the PC)
Elements available
  • MPSDK .NET library available on demand
  • Communication Dll supplied
Supported programming languages
  • C, C++, VB, Java, .NET
  • Any language that supports Dll
Embedded development (the code is executed directly by the MP300)
Recommended cross compiler
  • Windriver compiler (prefered version : 4.4b)

User Interface

MPScope, MVPi

The MP300 TPC1 can be accessed using several ways :

  • First, using the driver dll that we supply, which enables the user to access all functionnalities of the MP300 TPC1 from any programming language that supports Dll
  • For users prefering to embed their code directly inside the MP300 TPC1, Micropross has designed the SORB interface, which completely encapsulates all programming tasks related to the management of embedded applications, and lets the user focus on the smartcard oriented code
  • Finally, we can also supply our own user interface, MVPi, which elegantly conciliates convenience of use, high throughput and stability.

MVPi is able to handle up to 32 test heads at the same time, but upgrades are easily possible.

 
The main window of MVPi


 

Statistics are available, either separated between all test heads, or displayed for the whole system

 
Here, the number of failures, and the reason of the failure, for the head 3


 

More statistics are available, showing the current test time, as well as the average one.

 
Here, total of good, bad chips, and the testing time


 

As smartcards are being produced, logfiles are also generated, that allow to keep track of the produced components. The content of this logfile is controlled by the user.

 
An example of logfile produced by MVPi


 


Micropross supplies a complete range of accessories for the MP300 TPC1, that include :

  • Various sizes of rack housing, who allow to protect the Micropross testers from any kind of danger
  • External smartcard readers, for application development, or integration into manual working places
  • Oscilloscope probe adapters
  • The MVPi software interface, that allows to easily integrate our MP300 production tools inside production machines

We also supply packages to extend the warranty of the tester. Please ask us for the maintenance contracts available.