MP300 TC3 + MP300 TCL2
The most advanced combi card testing solution using the combination of MP300 TC3 and MP300 TCL2
Simple synchronisation link
Contact and contactless exchanges displayed on the same time base
Convenient data display thanks to the MPManager software suite
Possibility to do parametric tests on both contact and contactless interfaces of the combi card
The main features of the combination MP300 TC3 + MP300 TCL2 are :
- Spy of ISO/IEC 7816-3, SWP, USB 2.0, ISO/IEC 14443, Mifare TM, FeliCa TM, ISO/IEC 15693 exchanges on one single session
- Convenient display of the captured data using the MPManager software
- Contact and contactless exchanges can be synchronised for better
- Simple to setup
- Possibility to check the influence of one interface on the other
- All features of both MP300 testers remain available
- Enables to capture a complete NFC transaction
The combination of MP300 TC3 + MP300 TCL2 will typically be used in the following contexts :
- Characterisation of a dual interface smartcard
- Debug of a CLF (contactless front end)
MP300 TC3 : Supported protocols
ISO/IEC 7816-3 |
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T=0 and T=1 protocols |
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Hardware acceleration |
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USB 2.0 |
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Available speeds |
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Classes |
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USB-IC |
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SWP (ETSI TS 102 613 and TS 102 622) |
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SWP transmission |
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LLC layers support |
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Evolutivity |
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Synchronous chips (memory chips) |
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Available libraries |
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Custom protocols development |
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Hardware acceleration |
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Raw mode |
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Gives the possibility to exchange frames without any Protocolary encapsulation |
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Out of standard chips support |
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Benefit from Micropross'experience in smart card programming |
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MP300 TC3 : Programmable parameters
Physical parameters |
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Voltages |
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Vcc |
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Vol |
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Voh |
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Vil |
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Vih |
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Frequency |
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ISO 7816 clock frequency |
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ISO 7816 clocy duty cycle |
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Rise and fall times |
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Vcc |
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C2, C3, C4, C6, C7, C8 |
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Pin states |
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All pins are independent from each other, and can be separately managed |
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ISO 7816 communication parameters |
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ETU with |
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BGT, initial ETU width |
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BWT, CWT, EGT, RGT, WWT |
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Clock stop at high or low state |
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Clock stop tG and tH timings |
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Parity control |
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Input parity error checking |
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Pull-up resistor |
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SWP communication parameters |
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Baudrate |
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SWP duty cycle (definition of SWP S1 high and low states duration) |
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SWP S2 detection threshold |
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Activation time, P2, P3 timings |
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USB-IC parameters |
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USB-IC specific attachment procedure |
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Voltage classes supported |
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MP300 TC3 : Spy feature
Accuracy |
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Signals displayed |
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Protocols supported |
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Type of events displayed |
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MP300 TC3 : Available tests
Electrical tests |
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Open/short test |
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Available contacts |
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Forced current |
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Leakage current measurement |
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Available contacts |
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Measurement ranges |
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Voltage measurement |
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Available contacts |
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Range available |
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Modes available |
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Current measurement |
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Available contacts |
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Ranges available |
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Modes available |
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Parametric tests |
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Available contacts |
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Modes available |
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SWP specific measurement functions |
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S2 signal characterisation |
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Logical tests |
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Anti tearing test |
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Simulate the chip's immunity against tearing from the reader |
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Timing measurement |
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Measure the chip response to a command |
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Concurrent I/O testing |
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Simultaneous sending of characters in ISO/IEC 7816 and SWP, with a user defined time offset (can be 0 ns) |
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Personalisation assisted by hardware |
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Do not lose a microsecond while sending data to the chip thanks to the hardware assisted data sending mechanism |
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MP300 TC3 : Sequencer tests
Generation of glitches on Vcc, C3, C6 |
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Modification at a user defined moment of the state of a pin |
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Sending out of standard frames/provoking collisions |
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Creation of custom activation/deactivation sequences |
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Generation of parity errors on transmission, simulation of parity errors on reception |
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Management of triggers |
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Sudden modification of an electronic parameter |
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Definition of the time between two commands |
MP300 TCL2 : Supported protocols
ISO/IEC 18092 (NFC-IP1, NFC-IP2) and NFC Forum |
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Communication modes supported |
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ISO/IEC 14443-3 (proximity cards) |
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Type A |
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Type B |
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Anticollision |
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T=CL protocol |
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Supported baudrates |
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B’ (Innovatron) |
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Supported |
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ISO/IEC 15693 (vicinity cards) |
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Coding type |
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Encoding modes |
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ISO 18000-3 Mode 1 |
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Supported |
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Mifare TM |
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Types supported |
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Encryption |
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FeliCa TM |
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Available baudrates |
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Encryption |
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Raw mode |
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Gives the possibility to exchange frames without any protocolary encapsulation |
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Out of standard chips |
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Benefit from Micropross’experience in smartcard programming |
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MP300 TCL2 : Programmable parameters
Physical parameters (contacless interface) |
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Field strength |
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Modulation index |
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Field rise time |
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Carrier frequency |
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Modulation rise and fall times |
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Logical tests (contact interface) |
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Type A pause width |
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Frame waiting time |
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Type B framing (SOF, EGT, EOF, bit duration) |
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TR2 timing |
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Communication speed |
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MP300 TCL2 : Spy feature
Resolution |
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Events displayed |
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MP300 TCL2 : Available tests
Electrical measurements |
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Resonance frequency measurement (loaded and unloaded modes) |
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Range |
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Q factor measurement |
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Chip impedance |
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Frequency at which the measurement is done |
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Magnetic field measurement |
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Logical testing |
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Automatic testing |
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Send type A command, wait, send type B command and receive answer (for type B cards) |
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Send type B command, wait, sent type A command and receive answer (for type A cards) |
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Switch on field, wait, send request command (A or B), receive answer |
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Send request, wait, send request, receive the answer |
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Antitearing |
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PICC reset characterization |
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Check minimum FDT (frame delay time) |
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Testing through API manipulation |
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Response time measurement (FDT, TR0, TR1) |
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Sending of out of standard frames |
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Sending misformed blocks (wrong number of bits) |
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Retro modulation ratio measurement |
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Distance simulation checking |
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Separated RX channel allowing communication using a RF amplifier |
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MP300 TCL2 : Triggers
The MP300 TCL2 offers many triggers, to synchronise or to be synchronised by external laboratory devices (oscilloscopes,...) |
MP300 TCL2 : Physical information
Weight (Uniterary rack package) |
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Dimensions (Uniterary rack package) |
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MP300 TCL2 : Communication parameters
USB 2.0 |
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TCP/IP 10/100 Mbps |
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RS 232 |
MP300 TCL2 : Software development
Remote development (the code is executed from the PC) |
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Elements available |
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Supported programming languages |
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Embedded development (the code is executed directly by the MP300) |
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Recommended cross compiler |
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MP300 TCL2 : User Interface
MPManager |
The software that is used for the display of the trapped exchanges is MPManager.
Once the spy session is over, the “Viexer” window of MPManager shows all signals that have been spied (contact and contactless exchanges)
The viewer window of MPManager also gives a graphical display of the trapped exchanges.
For example on the following screenshot, we have a contactless command (starting a payment application). This command will be in fact executed by the U-SIM. The contactless frame thus needs to be translated into SWP
The time between the contact, and the SWP blocks, is the time it takes to the NFC component to do the translation job.
By positionning two cursors, we will know how long it takes to the NFC component to perform this job.
The red cursor is set at the beginning of the SWP frame.
MPManager gives us the time difference between both cursors
- A SIM to ISO converter
- Numerous shapes of probes, to use this tester with different types of contact smartcard readers and handsets
- A probe to enable spying sessions between a smartcard and an external reader
- A probe for oscilloscope connection
- Different sizes of antennas, to handle any kind of form factors
We also supply packages to extend the warranty of the tester. Please ask us for the maintenance contracts available.






T=0 and T=1 protocols




