MP300 TC3
- The MP300 TC3 is the certified solution for compliance checking of contact smartcards with the EMVCo 4.2b and 4.2c specifications. (full coverage of Level 1 electrical and digital tests)
- The MP300 TC3 is now a fully I2C compatible tester and spy. Available through firmware update.
- Test suite ETSI TS 102.694-2 (SWP) and ETSI TS 102.695-2 (HCI), validated by the GCF/PTCRB available
- Supports the ISO/IEC 7816, USB 2.0, USB-IC, SWP/S-HDLC/HCI and I2C protocols
- Spies the dialogue happening between itself and the device under test
- Numerous physical measurement features
- Able to include perturbations inside the dialogue
This tester will typically be used in the following contexts :
- Debug of a smartcard operating system
- Quality inspection tasks
- Compliance checking of a smartcard with defined standards
- Electrical qualification of a smartcard or a micro-module
The main features of the MP300 TC3 are :
- Emulation of a contact smartcard reader, or a CLF
- Compatible with smarcards, micro-modules, M2M components
- Support of the ISO/IEC 7816-3 and -4, USB 2.0 and –IC, SWP/S-HDLC/HCI protocols and various types of memory chips
- Completely supports the ETSI TS 102 613 and TS 102 622 specifications
- Integrates the support of the I2C protocol (spy and reader), with definition of all timing parameters
- Open for implementation of custom protocols
- Endless possibilities of protocolary customisation
- Possibility to adjust all electrical parameters
- Spy of ISO/IEC 7816-3 and –4, USB and SWP interfaces, with comprehensive protocol analysis
- Advanced physical measurement characteristics (open/short, consumption, leakage current, drivability, ...)
- Accurate timing measurement features
- Hardware sequencer, for a perfect test scenario repetition and advanced protocol testing
- Open platform : integrate the MP300 TC3 inside your own test platform
- Supplied with the MPManager software suite, enabling the complete control of the tester without any programming knownedge
- Integrated in numerous third parties test suites, including test cases for ISO/IEC 7816-3, Visa Level 1, EMVCo Level 1, ETSI TS 102 613 and TS 102 622 compliance checking
- Presence of numerous business oriented interpreters, including SWP/S-HDLC/HCI, EMV, GSM, 3G, LTE, for a better understanding of all spied exchanges.
Supported protocols
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ISO/IEC 7816-3 |
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 Hardware acceleration |
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| T=0 and T=1 protocols |
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USB 2.0 |
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| Available speeds |
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| Classes |
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USB-IC |
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SWP (ETSI TS 102 613 and TS 102 622) |
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| SWP transmission |
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| LLC layers support |
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| Evolutivity |
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Synchronous chips (memory chips) |
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| Avalaible librairies |
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| Custom protocols development |
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| Hardware acceleration |
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Raw mode |
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| Gives the possibility to exchange frames without any protocolary encapsulation |
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Out of standards chip support |
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| Benefit from Micropross' experience in smart card programming |
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Programmable parameters
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Physical parameters |
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Voltages |
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| Vcc |
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| Vol |
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| Voh |
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| Vil |
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| Vih |
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Frequency |
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| ISO 7816 clock frequency |
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| ISO 7816 clocy duty cycle |
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Rise and fall times |
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| Vcc |
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| C2, C3, C4, C6, C7, C8 |
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Pin states |
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| All pins are independent fom each other, and can be separately managed |
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ISO 7816 communication parameters |
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| ETU width |
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| BGT, initial ETU width |
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| BWT, CWT, EGT, RGT, WWT |
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| Clock stop at high or low state |
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| Clock stop tG and tH timings |
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| Parity control |
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| Input parity error checking |
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| Pull-up resistor |
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SWP communication parameters |
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| Baudrate |
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| SWP duty cycle (definition of SWP S1 high and low states duration) |
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| SWP S2 detection threshold |
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| Activation time, P2, P3 timings |
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USB-IC parameters |
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| USB-IC specific attachment procedure |
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| Voltage classes supported |
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Spy feature
| Accuracy |
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| Signals displayed |
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| Protocols supported |
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| Type of events displayed |
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Available tests
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Electrical tests |
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Open/short test |
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| Available contacts |
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| Forced current |
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Leakage current measurement |
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| Available contacts |
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| Measurement ranges |
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Voltage measurement |
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| Available contacts |
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| Range available |
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| Modes available |
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Current measurement |
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| Available contacts |
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| Ranges available |
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| Modes available |
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Parametric tests |
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| Available contacts |
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| Modes available |
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SWP specific measurement functions |
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| S2 signal characterisation |
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Logical tests |
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Anti tearing test |
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| Simulate the chip's immunity against tearing from the reader |
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Timing measurement |
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| Measure the chip's response to a command |
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Concurrent I/O testing |
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| Simultaneous sending of characters in ISO/IEC 7816 and SWP, with a user defined time offset (can be 0 ns) |
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Personalisation assisted by hardware |
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| Do not lose a microsecond while sending data to the chip thanks to the hardware assisted data sending mechanism |
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SWP framing tests |
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| Possibility to send frames at a bit per bit level, enabling the sending of data without bit stuffing, or with CRC errors. |
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Sequencer tests
| Generation of glitches on Vcc, C3, C6 |
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| Modification at a user defined moment of the state of a pin |
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| Sending out of standard frames/provoking collisions |
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| Creation of custom activation/deactivation sequences |
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| Generation of parity errors on transmission, simulation of parity errors on reception |
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| Management of triggers |
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| Sudden modification of an electronic parameter |
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| Definition of the time between two commands |
Triggers
| The MP300 TC3 offers 5 triggers, to synchronise or to be synchronised by external laboratory devices (oscilloscopes,...) |
Physical information
| Weight (Unitary rack package) |
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| Dimensions |
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Communication parameters
| USB 2.0 |
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| TCP/IP 10/100 Mbps |
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| RS 232 |
Software development
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Remote development (the code is executed from the PC) |
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| Elements available |
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| Supported programming languages |
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Embedded development (the code is executed directly by the MP300) |
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| Recommended cross compiler |
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User interface
| MPManager |
The MP300 TC3 is supplied with the MPManager software, whose aim is to open all of the tester's functionalities, accessible just with mouse clicks.
First, the MPManager software will make it possible for you to define all electrical settings, including applied voltages, the clock frequency, the rise and fall time of all signals.
This user interface will allow you to edit your test scripts, starting from the library of commands available. They cover a full range of functionalities, such as sending APDU commands, or launching electrical measurement
MPManager also allows you to visualise all exchanges that happened between the MP300 TC3 and the smartcard. Data is displayed both as a tree, where a deep analysis is supplied, and as a chronogram, which gives the possibility to measure all kind of timings (response times, activation time, ...)
Many possibilities are offered to edit HCI commands, and send them to the smartcard
Once executed, a test sequence can be visualised using MPManager's high level interpreters.
The integrated oscilloscope shows you the analog waveshapes, synchronised with the digital signals.
This user interface gives also access to all electrical measurements of the smartcard. For example, the shmoo plot window will make it possible for you to study the influence of the combination of several electrical or protocolary parameters on the execution of a given script.
This user interface also allows to launch dynamic measurement. This feature allows you to have a clear vision of the current or the voltage on a given contact, as time goes by.
- a SIM to ISO converter
- an external smartcard reader (ideal companion to perform testing in temperature controlled environments)
- probes to enable spying sessions between a smartcard and an external reader
- a probe for oscilloscope connection
We also supply packages to extend the warranty of the tester. Please ask us for the maintenance contracts available.
